Work place: Department of Computer Science, Banasthali Vidyapith, Vanasthali, Niwai,Rajasthan, India
E-mail: sharmaneelam27@gmail.com
Website:
Research Interests: Computational Learning Theory, Pattern Recognition
Biography
Dr. Neelam Sharma is a Assistant Professor at the Department of Computer Science, Banasthali University. She has completed her PhD in Computer Science and has 13 years of teaching experience and research interests includes machine learning, pattern recognition.
By Deepti Nathawat Manju Mandot Neelam Sharma
DOI: https://doi.org/10.5815/ijmecs.2018.08.05, Pub. Date: 8 Aug. 2018
Many applications of artificial vision need to compare or integrate images of the same object but obtained at different moments of time with different devices (cameras), from different positions, under different conditions, etc. These differences in capture give rise to images with important relative geometric differences that prevent these "Fit" with precision over each other.
The registry eliminates these geometric differences so that located pixels in the same coordinates correspond to the same point of the object and, therefore, both images can easily be compared or integrated. The registration of images is essential in disciplines such as remote sensing, radiology, robotic vision, etc. ; Fields, all of them, that overlap images to study environmental phenomena, monitor tumours carcinogenic or to reconstruct the observed scene. This paper also study different measures of similarity used to measure their consistency and a novel procedure is proposed to improve the accuracy of the linear record by pieces. Specifically the elements that influence the estimation are analysed experimentally of probability distributions of the intensity levels of the images. These distributions are the basis for calculating measures of similarity based on entropy as mutual information (MI) or the Entropy correlation coefficient (ECC). Therefore, the effectiveness of these measures depends critically on their correct estimation.
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