Work place: Computer Science and Engineering, Amity University, Mumbai, 410206, India
E-mail: kshipra.tatkare@gmail.com
Website: https://orcid.org/0009-0002-9530-4551
Research Interests:
Biography
Kshipra Ashok Tatkare, she received the B.E. degree in Information Technology Engineering from Ramrao Adik Institute of Technology, Nerul, Navi Mumbai, in 2011 and the M.E. degree in Computer Science Engineering from Ramrao Adik Institute of Technology, Nerul, Navi Mumbai, in 2015. She is currently pursuing the Ph.D. degree in Computer Science and Engineering at Amity University, Mumbai, India and Associate Manager in MouriTech Pvt Ltd. From 2011 to 2013, she was working as a PHP Developer. During this period she worked on different Content Management Systems (CMS) like Joomla, PHPFox, Skadate, Dolphin, WordPress, Drupal etc. She got “Employee of the Month” for her best performance. From 2013 to 2015, she was working as a Teaching Assistant while pursuing M.E. degree and after pursuing master degree worked in same institute as an Assistant Professor till 2021. She has developed an educational application for her institute. She has published her research paper in 09 national and international conferences and Journals. Her research interest includes Cyber Security, Digital Forensics, Intelligent Systems and Search Engine Optimization.
By Kshipra Ashok Tatkare Manoj Devare
DOI: https://doi.org/10.5815/ijigsp.2025.01.06, Pub. Date: 8 Feb. 2025
New area of image processing termed "digital image forensics" aims to gather quantifiable proof of a digital image's authenticity and place of origin. Detection of forgery images to look for copied and pasted portions; however, depending on whether the copied portion underwent post-processing before being transferred to another party, the detection method may differ. Zernike Moments and Scale-Invariant Feature Transform (SIFT) combined are unique techniques that aid in the identification of textured and smooth regions. But compared to SIFT separately, this combination is the slowest. So in the proposed work, Block based image division and SIFT based key point detection model is developed to detect forgery images. The gathered images are poor visual quality and various dimension, so it is resized and converter grayscale conversion. In addition, pixel values of images are improved using optimal Gaussian filter and adaptive histogram equalization which remove noise and blurring based on sigma value. Then, using the SIFT key point extraction algorithm to extract the image's key point and compute the feature vector of each key-points. In that using a block based matching technique to split the pre-images into blocks, and each blocks are diagonally subdivide. Length of the feature vector is computed using Zernike moments of each blocks. Both SIFT features and Zernike moments features are matched to identify the manipulated image from the given data. The proposed model provides 100% recall, 98.2% precision, and 99.09% F1_score. Thus provide the proposed model was effectively detects forgery image in the given data.
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